Nearfield and Farfield Measurements
| All-in-one nearfield and farfield scanning mechanisms |
- LCM-100
Launch Condition Meter
The LCM Launch Condition Meter is a convenient benchtop instrument for analyzing characteristics and geometry of optical fibers. Use Santec's software to scan and easily plot both the Nearfield and Farfield patterns. Compare to standard launch templates such as the IEC 61280-4-1 Encircled Flux standard. The LCM can be equipped with two internal LEDs with 850 nm and 1300 nm wavelengths. Internal 105/125µm, 0.22NA fiber allows for overfill testing in most applications. The optical interface of the instrument accepts all standard 2.5mm ferrules. Other connector sizes are available upon request.
Ensure standards compliance
Software analyzes nearfield scan to ensure encircled flux compliance.
Mode field diameter measurements
Using the farfield scanning feature measure mode field diameter per the reference method in IEC 60793-1-45
Auto-Alignment and Focus
Ensure measurements are accurate with the auto-alignment and focusing method.
