High Power Tunable Laser

The new TSL-570 type H tunable laser is a high-performance, high-power model with peak optical output power over 20 dBm. The advanced optical cavity design enables picometer accuracy, sub-picometer resolution and high scanning speeds up to 200 nm/s. The TSL-570 type H can cover the O-band tuning range of 1260 - 1360 nm or the CL-band tuning range 1500 - 1630 nm.

Santec’s Tunable lasers are used extensively in photonics; for optical component characterization, photonic integrated circuit testing, quantum photonics, spectroscopy, and sensors. In particular, as a high output power tunable light source, the TSL-570 type H is useful for verification and evaluation of silicon photonics, which consist of densely integrated optical devices that exhibit large material loss and coupling loss.

In addition, even in the wavelength range (1260 - 1360 nm) outside LAN-WDM, the output of the TSL-570 type H exceeds +16 dBm, and the TSL-570 type H enables the testing of transceivers for 100/400 GE as well as next-generation 800 GbE and 1.6 TbE.

The TSL-570 type H is a high-specification, full-feature instrument, suitable for all applications. It has a simple-to-use touch panel display as well as Ethernet, GPIB and USB interfaces for remote control.

• Ultra high output power +20 dBm
• Fast, up to 200 nm/s, wavelength sweeps
• Wide tuning range lineup: 1260 - 1360 / 1500 - 1630 nm
• Wavelength resolution: 0.1 pm
• Fine tuning scan range: 10 GHz

• Silicon Photonics testing
• Optical Component testing
• Optical spectroscopy

Please refer to this link for details. -> Swept Test System

Silicon photonics has become a foundational technology in high-speed data communication, integrated photonic circuits (PICs), and next-generation optical systems. This comprehensive whitepaper delivers an in-depth, engineer-friendly introduction to silicon photonics — exploring its physical principles, key device architectures, and measurement challenges.

In this whitepaper, you will discover:

1. The fundamentals of silicon photonics: waveguides, modulators, and photodetectors

2. Common silicon photonic device designs (e.g., ring resonators, Mach-Zehnder modulators)

3. Key performance metrics, such as insertion loss, extinction ratio, and modulation bandwidth

4. Measurement techniques and best practices for silicon photonic component testing

5. How tunable lasers, stable wavelength sources, and precision power meters can be integrated into a silicon photonics test setup

6. Practical system design tips to improve measurement accuracy and yield

This guide also explains how Santec’s tunable lasers, wavelength stabilization solutions (Laser Lock Pro), and high-performance optical power meters can support your silicon photonic device development and qualification workflow.

Read the full whitepaper

Co-packaged optics (CPO) is revolutionizing data center and high-performance computing interconnects by integrating optical engines directly with switching ASICs. This whitepaper offers a detailed, engineer-level exploration of CPO, covering both the technological benefits and the rigorous testing requirements needed to ensure performance and reliability.

In this whitepaper, you will discover:

1. The key drivers for CPO adoption — power efficiency, bandwidth scaling, signal integrity, and form-factor optimization

2. How photonic integrated circuits (PICs) enable compact, high-density optical I/O in CPO architectures

3. Thermal challenges in co-packaged designs and best practices for thermal management during testing

4. Testing strategies for CPO modules: measuring insertion loss, return loss, polarization effects, crosstalk, and more

5. Advanced measurement solutions: how Santec’s tunable lasers, polarization synthesizers, power meters, and swept analyzers (e.g., STS system, SPA-110) can be integrated into high-precision CPO validation setups

6. Practical tips for building an automated, repeatable test flow that addresses the unique trade-offs of co-packaged optics

Whether you're developing PICs for production, characterizing module-level performance, or optimizing test processes for yield and scale, this guide shows how Santec’s measurement instruments support every aspect of CPO development.
Read the full whitepaper