Resolve the smallest structures inside your SiPh device
With better than 5 μm of resolution the finest structures inside a device can be resolved.
- SPA-110
Swept Photonics Analyzer
(Long range model)
- Industry's highest-resolution reflectometer (<5 μm)
- Measure insertion loss and return loss on optical components
- Improved 30m measurement range
- Proximity sensing for silicon photonic alignment and testing
- Integrates with Santec TSL-570 (also TSL-550/TSL-710/TSL-770)
- Feedthrough port for integration of OPM for active alignment of Silicon Photonic Device
- Polarization maintaining fiber for Silicon Photonic applications
- Wide sweeping range for WDL measurements (up to 160 nm)
- Available in O-band and CL-band configurations.
- Wide dynamic range (>80 dB) for WDL measurements with no gain switching
- Easy analysis software included
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Description
The SPA-110 is the next generation of Santec's swept photonics analyzers. It serves as a convenient optical frequency domain reflectometry (OFDR) add-on module for Santec's tunable lasers. When paired, this complete system can analyze even the most compact and complex optical components, providing detailed results for reflectance, transmission, propagation loss, and distance to events.Â
The complete system uses Optical Frequency Domain Reflectometry (OFDR) technology to analyze the back reflection and transmission characteristics of fiber optic devices and components in the spatial domain. It generates a trace similar to that of an Optical Time Domain Reflectometer (OTDR) but with significantly higher resolution and precision. With a sampling resolution of 5 µm, the system easily discerns structures within photonic integrated circuits (PICs) and silicon photonic (SiPh) devices.
The SPA-110 builds on Santec’s SPA-100 technology by extending the total measurement range from 5m to 30 meters. This increased range accommodates the addition of optical signal conditioning devices, such as polarization controllers and optical switches, within the fiber optic setup. This enhancement makes the system particularly suitable for more comprehensive characterization of small devices like silicon photonic circuits, fiber optic components, and compact fiber optic assemblies.
Furthermore, the extended scan length allows for the analysis of longer fiber optic cable assemblies with closely spaced components, where OTDR technology might struggle to distinguish between them.
With the wide selection of tunable lasers, the OFDR system is highly configurable to function over the spectrum of importance to the device being measured. The system is offered in an O-band configuration (1260 to 1350nm range) as well as a CL band configuration (1480 to 1640nm range). No need to be limited to a small wavelength range.
Measure WDL with wide wavelength sweeping range
Measure WDL with a single gain stage (>80 dB) and a wide wavelength range of up to 160 nm.
Improved 30m measurement range
Allows for integration of optical signal conditioning into measurement setup and analysis of long cable assembly lengths.
Easy analysis software included
Analyze reflective events, define multiple refractive indexes of different materials, calculate waveguide attenuation, save and load data.
Proximity sensing for SiPh probe alignment
| Use the fiber probe itself to sense distance from the silicon wafer to reduce cost of expensive imaging systems |
Integrate with OPM for active SiPh alignment
System has built in feedthrough port to integrate an external OPM for active alignment.
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