高功率重复性 <±0.02 dB
高PDL 重复性 ±0.03 dB
- STS
光学器件扫描测试系统
- 实时功率校正
- 精确 WDL/PDL 特性测量
- 高功率重复性<±0.02 dB
- 高PDL 重复性 ±0.03 dB
- 高波长分辨率和精度
- 可进行多通道测量
- 简易测量参数建立
- 数据分析
描述
Santec快速扫描系统由TSL系列可调谐激光器,MPM系列多通道功率计,PCU-110偏振控制器组成。Santec专用的软件使得系统测量IL,WDL和PDL时最优化,既可用于研发,也可用于生产环境。
通过实时校正,从可调谐激光器中同时获得输出功率,通过DUT传输到功率计,系统通过穆勒矩阵法提供高精度的IL,WDL,PDL分析。
Santec的MPM-210H功率计主机也可与4通道电流计模块 MPM-213结合使用。扫描测试系统与MPM-210H/MPM-213 的相结合,适用于测试光纤组件的性能,例如收发器的光电二极 管(ROSA/Coherent receiver等)或光信道监
重缩放算法可实现高波长精度和减少测量时间
每台主机最多20通道
支持用户图形界面及DLLs (Visual Studio)
数十年经验,满足您的定制需求
应用
- 器件及模块的光学特性:
- 可调谐滤波器, 交织器, 光纤光栅, 耦合器, 分离器, 隔离器, 开关等
- WSS和波长阻隔器
- DWDM器件 - 硅光子材料特性 , 包括微腔环形谐振器
- 光谱学
- 干涉测量
WDL(波长损耗)测量
80 dB或以上的高动态范围测量
Santec可调谐激光器TSL系列创新的腔体设计,可降低光ASE噪音,高信噪比超过90 dB / 0.1 nm以上,并且同时保持高输出功率 + 10 dBm以上。TSL系列可完美针对高密度波分复用(DWDM)和波长选择开关(WSS)等下一代光器件测试。以下图表是CWDM滤波器和陷波滤波器(如FBG)的测量数据。


高波长精度+/- 3 pm
Santec可调谐激光器TSL系列配备有标准的波长监测器,是非常理想的光无源器件高精度测试仪器。下图是 Acetylene (12C2H2) 波长测量数据,从中可以看出高测量精度。


高波长分辨率小于 0.1 pm
Santec 快速扫描测试系统不仅可以进行光器件WDL测量,还可以测试高密度波分复用(DWDM),AWG,波长选择开关(WSS)或更多,而且在连续扫描时,有效保持超窄滤波器 (Ultra-high Q 腔体装置) 高分辨率。

配置
Polarization Dependent Loss Measurement

- Tunable Laser TSL-775 / TSL-570
- Polarization Controller PCU-110
- Optical Power Meter MPM-220

- Tunable Laser TSL-775 / TSL-570
- Optical Power Meter MPM-220
资源
文档
联系我们Technical Whitepaper: Insertion Loss Testing Methods Explained
Why Insertion Loss Matters
Insertion loss—the reduction of signal power as it travels through optical components or fiber—is a critical factor in ensuring the performance and reliability of modern communication systems. Whether in telecommunications, data centers, photonics, or aerospace, accurate insertion loss testing is essential to minimize signal degradation, maintain data integrity, and optimize system efficiency
What You’ll Discover in This Whitepaper
This technical guide provides engineers and industry professionals with a comprehensive overview of insertion loss testing methods, focusing on accuracy, repeatability, and practical trade-offs. Learn how to:
1. Understand the Fundamentals Master the core principles of insertion loss measurement, including how it impacts signal transmission and system performance.
2. Identify and Minimize Errors Explore common sources of measurement errors—such as connector misalignment, fiber bends, and environmental factors—and discover best practices to mitigate them.
3. Compare Testing Methods Evaluate the strengths and limitations of:
- Broadband Testing: Ideal for general applications requiring quick, cost-effective measurements.
- Swept-Wavelength Testing: Offers high precision across a range of wavelengths, perfect for advanced optical characterization.
- Fixed-Wavelength Testing: Provides stability and repeatability for specific applications.
4. Optimize Test Configurations Gain insights into recommended setups for high-precision testing, including the use of tunable lasers and power meters.
5. Leverage Advanced Tools Discover how Santec’s tunable lasers, Laser Lock Pro, and optical power meters enhance measurement stability and repeatability, delivering low-uncertainty results across C-, L-, and extended wavelength bands.
Read the full whitepaper
Co-Packaged Optics – Redefining Interconnects with Precision Testing
Co-packaged optics (CPO) is revolutionizing data center and high-performance computing interconnects by integrating optical engines directly with switching ASICs. This whitepaper offers a detailed, engineer-level exploration of CPO, covering both the technological benefits and the rigorous testing requirements needed to ensure performance and reliability.
In this whitepaper, you will discover:
1. The key drivers for CPO adoption — power efficiency, bandwidth scaling, signal integrity, and form-factor optimization
2. How photonic integrated circuits (PICs) enable compact, high-density optical I/O in CPO architectures
3. Thermal challenges in co-packaged designs and best practices for thermal management during testing
4. Testing strategies for CPO modules: measuring insertion loss, return loss, polarization effects, crosstalk, and more
5. Advanced measurement solutions: how Santec’s tunable lasers, polarization synthesizers, power meters, and swept analyzers (e.g., STS system, SPA-110) can be integrated into high-precision CPO validation setups
6. Practical tips for building an automated, repeatable test flow that addresses the unique trade-offs of co-packaged optics
Whether you're developing PICs for production, characterizing module-level performance, or optimizing test processes for yield and scale, this guide shows how Santec’s measurement instruments support every aspect of CPO development.
Read the full whitepaper