The PCU-200 is a versatile polarization controller designed for PDL measurements using the Mueller Matrix method. With a wide operational range of 1260 to 1650 nm, it provides a single-platform solution for O, E, S, C, and L-band testing.
Ideally suited for Polarization Dependent Loss (PDL) measurements using fixed or tunable sources. It integrates seamlessly with Santec’s Swept Test System (STS) to automatically apply the Mueller Matrix, providing PDL data as a function of wavelength.
Features a specialized searching and locking algorithm designed to couple single-mode sources into polarization-sensitive devices, such as Photonics Integrated Chips (PICs), with maximum efficiency.
For setups requiring multiple tunable lasers, a "Wideband" option is available featuring an integrated, low-loss 1x4 Polarization Maintaining (PM) switch to combine up to four inputs.
Capable of a State of Polarization (SOP) switching speed of 125 ms, allowing for high-throughput testing in both R&D and QA environments.
