APPLICATIONS
Select an application to view a practical measurement overview: what to test, how to structure the setup, and what performance to expect. Each page includes recommended Santec instruments and typical configurations for both R&D and production environments.
Explore our Applications
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Read more about Component Characterization TestingComponent Characterization TestingFast swept IL/PDL/WDL + back-reflection screening for passive and multi-port components—repeatable results from R&D to production. -
Read more about Cable AssemblyCable AssemblyHigh-throughput IL/RL/polarity testing with repeatable, traceable results—built for speed, accuracy, and production-ready automation. -
Read more about Wafer/Chip Level TestingWafer/Chip Level TestingReal-time, scalable wafer/die test workflows—spectral characterization + in-situ troubleshooting to boost yield before packaging. -
Read more about SiPh PIC DevelopmentSiPh PIC DevelopmentHigh-resolution spectral characterization, in-situ PIC troubleshooting—flexible workflows to speed validation, debug, and design iteration. -
Read more about Manufacturing Process MonitoringManufacturing Process MonitoringInline-capable optical metrology for process control—fast 3D scans and wafer mapping to catch drift early and protect yield. -
Read more about Quantum PhotonicsQuantum PhotonicsFast swept IL/PDL/WDL + back-reflection screening for passive and multi-port components—repeatable results from R&D to production.
