Highly Scalable Modular Platform
The modular STP-100 supports up to six slots, allowing customized test configurations for a wide range of optical measurement applications.
- STP-100
Swept Test Platform
A next-generation swept measurement platform designed for AI-driven optical interconnects, silicon photonics, co-packaged optics (CPO), and high-density optical component testing.
- Wavelength range: 1240 to 1680 nm
- Up to 24 channels measurement
- Dynamic power range: -70 to +5 dBm
- Fast data transfer rates: up to 100 Mbps
- High-dynamic-range measurement within a single wavelength sweep
Description
The Swept Test Platform (STP-100) is a new platform optimized for high-speed swept measurements with santec’s tunable laser sources (TSL Series). Supporting up to six module slots, it can integrate optical power meter, polarization controller, and optical switch modules. With data transfer speeds up to 100 Mbps, four times faster than the previous model, the STP-100 significantly improves measurement efficiency for applications ranging from R&D to production testing. It also enables easy configuration of optical characterization systems for measurements such as insertion loss (IL), wavelength-dependent loss (WDL), and polarization-dependent loss (PDL).
The MPM-315 is a high-dynamic-range 4-channel optical power meter module designed for the STP-100. Utilizing proprietary detection technology, it provides wide-range, high-accuracy optical power measurements within a single wavelength sweep, enabling more efficient optical characterization. The STP-100 supports LAN, USB, and GPIB interfaces, and both products maintain command compatibility with existing MPM Series instruments, allowing seamless migration from current test systems.
Up to 4 Times Faster Data Transfer for Improved Test Efficiency
Up to 4× faster data transfer significantly reduces measurement time, enabling faster and more efficient optical device testing.
Supports Optical Power Measurement Systems with Up to 24 Channels
Support for up to 24 measurement channels enables efficient testing of multi-port optical devices and optical switches.
High-Dynamic-Range Measurements in a Single Wavelength Sweep
The 4-channel MPM-315 delivers a wide dynamic range in a single sweep, enabling faster, more accurate testing of high-loss and wavelength-dependent optical devices.
Applications
- Optical power measurements
- IL, WDL and PDL measurements (Swept Test System)
