Even with the significantly extended measurement range, the SPA‑200 maintains a high spatial resolution of 5 µm, enabling accurate evaluation of minute reflection points and loss factors.
- SPA-200
Swept Photonics
Analyzer
- RL & IL distribution analysis
- Measurement range 250 m
- Spatial resolution 5 µm
- RL and IL accuracy +/-0.2 dB (Polarization independent)
- High dynamic range WDL measurement
- O-band and CL-band available
Description
The SPA‑200 is an advanced analytical instrument that enables highly accurate detection of reflection points and defect locations, precise measurement of minute losses, and characterization of waveguide propagation loss—capabilities essential for optical fiber cable assembly and photonics device testing.
With the SPA-200, the maximum measurement range has been extended to 250 meters, more than eight times that of the previous model (SPA-110), enabling inspection of long optical fiber cable assemblies and complex photonic systems. In addition, the SPA-200 incorporates a newly developed polarization-independent detector, which significantly improves loss measurement accuracy for non-polarization-maintaining devices, ensuring higher measurement reproducibility and reliability.
Despite the substantial extension of the measurement range, the SPA‑200 maintains the same high spatial resolution of 5 µm as the previous model. These capabilities make the SPA-200 a powerful tool for applications ranging from silicon photonics and integrated photonic device research to optical cable assembly testing and automated test systems used in volume manufacturing environments.
With a maximum measurement range of up to 250 meters—more than eight times that of the previous model (SPA‑110)—the SPA‑200 supports inspection of long optical fiber cable assemblies.
Supporting precise small-loss measurements and waveguide propagation loss characterization, the SPA‑200 can be utilized across a wide range of applications—from research and development to production processes.
A newly developed polarization-independent detector reduces measurement variation in non-polarization-maintaining devices, significantly improving loss measurement accuracy.
Analyze reflective events, define multiple refractive indexes of different materials, calculate waveguide attenuation, save and load data.
Applications
- Optical cable assembly defect and loss measurement
- Loss and propagation analysis for CPO/PIC components
- Optical transceiver loss analysis
- Optical component and connector inspection
- SMF‑based component testing