TSL-580

High Performance Tunable Laser

Fast, up to 200 nm/s, wavelength sweeps
Wavelength resolution: 0.1 pm
High signal-to-noise ratio: 90 dB/0.1nm
Wide tuning range lineup: 1240-1640 nm
High output power: >15 dBm @peak
Narrow linewidth: 20 kHz (typ.) (Type Q)
Sweep linearity: <5 %

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Description

The TSL-580, the 8th generation of santec's high-performance tunable laser, combines a wide wavelength tuning range with high output power and a superior signal-to-noise ratio. Building on the sweep-speed control, wavelength resolution, wavelength accuracy and wide fine-tuning range established by the previous generations, the TSL-580 introduces a redesigned laser cavity and updated control electronics.

The new cavity design increases available output power while improving sweep linearity, providing a more powerful and more predictable source for swept-wavelength measurements. At the same time, the redesigned control electronics support a narrower linewidth, enabling more stable frequency behavior and more precise wavelength control in demanding optical test applications.

The TSL-580 is designed to work as the light source in automated optical test setups. In combination with santec optical power meters and polarization controllers, it can support Insertion Loss (IL) and Polarization Dependent Loss (PDL) measurements. Thanks to its high-performance features, the TSL-580 is suitable for optical component testing, PIC characterization, spectroscopy, sensing, and quantum photonics.

High Output Power Supports All Optical Devices

Through optimization of the laser cavity, the TSL‑580 achieves a peak optical output power exceeding +15 dBm (30 mW) in continuous-wave (CW) operation, surpassing that of previous models. This high output power enables stable measurement and evaluation even in applications where optical power is often insufficient, such as the characterization of optical devices with high insertion loss and surface grating coupling in silicon photonics.

Narrow Linewidth for High-Precision Measurements

With a newly redesigned control circuit, the TSL‑580 achieves a narrow linewidth of 20 kHz. This significantly reduces the impact of noise in measurements within extremely small spectral regions, enabling high-resolution observation for applications such as quantum optics and high-precision sensing.

Excellent Wavelength Sweep Linearity

By optimizing the drive system, wavelength sweep linearity has been improved to approximately twice that of previous models. This enhancement provides more stable wavelength sweeping and higher data accuracy in applications including spectroscopic analysis and sensing.

Wavelength Resolution and Accuracy

0.1 pm resolution and sub-pm wavelength accuracy

Market Leading SNR and SSE

90 dB/0.1 nm Signal-to-Noise ratio and ultra-low level of SSE

Datasheet