Santec introduces the RD-SP, a combined integrating sphere and polarity detector

SANTEC CORPORATION, a leading manufacturer of advanced optical components, tunable lasers, optical test equipment, and OCT systems, announces the product launch of the RD-SP remote-head integrating sphere and polarity detector. Compatible with Santec’s RLM Return Loss Meter and OSX Optical Switch, the RD-SP lets you test polarity, insertion loss (IL) and return loss (RL) in a single stage for multifiber assemblies such as MPO and duplex LC.

The widely anticipated RD-SP combines the Gen.2 integrating sphere technology already used in the RLM and RD-S with the polarity detector technology used in the RD-P, launched in 2022. This new detector no longer requires any operator intervention between the polarity and IL/RL test stage allowing for insertion loss, return loss, and polarity to be tested in one step. A typical 12 fiber MTP/MPO cable takes only 35 seconds from pressing start to completed results at 2 wavelengths for polarity, IL and RL

Tailored for automated high-volume production testing, Santec's complimentary Cable Assembly software streamlines the process—simply connect the reference cable from the device under test (DUT) to the RD-SP, click start, and let the software do the rest, eliminating operator errors and delivering over double the speed of other premium test solutions.

Revolutionize multifiber assembly testing with the RD-SP remote-head integrating sphere and polarity detector, designed to effortlessly integrate with Santec's RLM Return Loss Meter and OSX Optical Switch for advanced optical testing.

More details are available at: RD-SP product page

Features:

• Polarity and insertion loss all in one
• Mass production ready: based on ruggedized and proven RD-S and RD-P design
• Efficient: reduces technician interaction and is twice as fast as conventional polarity and IL methods

Fiber Array Units (FAU) have become a necessary tool for coupling light into and out of a photonic integrated circuit. Qualifying these assemblies for loss can be challenging due to the non-standard nature and compactness of the FAU assembly. Santec has released a new application note detailing the equipment requirements and testing methods to obtain repeatable and accurate loss measurements on such assemblies. Click the link below to download and read the application note.